論文

2013

Strong perpendicular exchange bias in sputter-deposited CoPt/CoO multilayers
J. Wang, T. Omi, T. Sannomiya, S. Muraishi, J. Shi, Y. Nakamura
Applied Physics Letters, 103, 042401, 2013.

Determination of Aberration Center of Ronchigram for Automated Aberration-Corrected Scanning Transmission Electron Microscopy
T. Sannomiya, H. Sawada, T. Nakamichi, F. Hosokawa, Y. Nakamura, Y. Tanishiro, K. Takayanagi
Ultramicroscopy, 135, 71-79, 2013.

Influence of interface roughness on the exchange bias of Co/CoO multilayers
J. Wang, T. Sannomiya, J. Shi, Y. Nakamura
Journal of Applied Physics, 113 (17), 17D707, 2013.

Perpendicular magnetic anisotropy and perpendicular exchange bias in sputter-deposited CoO/CoPt multilayer
J. Wang, T. Sannomiya, J. Shi, Y. Nakamura
Journal of Applied Physics, 113 (17), 17D714, 2013.

Triangular dislocation loop model for indented material
S. Muraishi
Mechanics of Materials, 56, 106, 2013.

Optical Resonances in Short-Range Ordered Nanoholes in Ultrathin Aluminum/Aluminum Nitride Multilayers
Y. Ikenoya, M. Susa, J. Shi, Y. Nakamura, A. B. Dahlin, T. Sannomiya
Journal of Physical Chemistry C, 117 (12), 6373-6382, 2013.

Mechanism of morphology transformation during annealing of nanostructured gold films on glass
T. Karakouz, A. B. Tesler, T. Sannomiya, Y. Feldman, A. Vaskevich, I. Rubinstein
Physical Chemistry Chemical Physics, 15 (13), 4656-4665, 2013.

Controlled polarity of sputter-deposited aluminum nitride on metals observed by aberration corrected scanning transmission electron microscopy
T. Harumoto, T. Sannomiya, Y. Matsukawa, S. Muraishi, J. Shi, Y. Nakamura, H. Sawada, T. Tanaka, Y. Tanishiro, K. Takayanagi
Journal of Applied Physics, 113 (8), 084306, 2013.

2012

Oscillatory Behavior of the Long-Range Response of Localized Surface Plasmon Resonance Transducers
O. Kedem, T. Sannomiya, A. Vaskevich, I. Rubinstein
Journal of Physical Chemistry C, 116 (51), 26865-26873, 2012.

Optical Properties of Nanohole Arrays in Metal-Dielectric Double Films Prepared by Mask-on-Metal Colloidal Lithography
J. Junesch, T. Sannomiya, A. B. Dahlin
ACS Nano, 6 (11), 10405-10415, 2012.

Interface roughness induced asymmetric magnetic property in sputter-deposited Co/CoO/Co exchange coupled trilayers
J. Wang, T. Sannomiya, J. Shi, Y. Nakamura
Journal of Applied Physics, 111 (7), 07D725, 2012.

Electrochemical plasmonic sensors
A.B. Dahlin, B. Dielacher, P. Rajendran, K. Sugihara, T. Sannomiya, M. Zenobi-Wong, J. Voros
Analytical and Bioanalytical Chemistry, 402 (5), 1773-1784, 2012.

Curie temperatures of CoPt ultrathin continuous films
W. Cai, S. Muraishi, J. Shi, Y. Nakamura, W. Liu, R. Yu
Applied Physics A, 107(3), 519-523, 2012.

Spin reorientation transition in (111) textured L10 CoPt layers
W. Cai, S. Muraishi, J. Shi, Y. Nakamura, W. Liu, R. Yu
Applied Physics A, 109(1), 69-73, 2012.

2011

Investigation of Plasmon Resonances in Metal Films with Nanohole Arrays for Biosensing Applications
T. Sannomiya, O. Scholder, K. Jefimovs, Ch. Hafner, A. B. Dahlin
Small, 7 (12), 1653-1663, 2011. (Cover Page Article)

Roles of L10 ordering in controlling the magnetic anisotropy and coercivity of (111)-oriented CoPt ultrathin continuous layers in CoPt/AlN multilayer films
W. Cai, J. Shi, Y. Nakamura, W. Liu, R. Yu
Journal of Applied Physics, 110, 073907, 2011.

Magnetic behavior of CoPt-AlN granular structure laminated with AlN layers
Y. Yu, J. Shi, Y. Nakamura
Journal of Applied Physics, 109, 07C103, 2011.

Emergence of (001) preferred orientation in AlN film using ultra-thin intermediate Pt layer
T. Harumoto, S. Muraishi, J. Shi, Y. Nakamura
Materials Technology, 26, 32-34, 2011.

2010

Enhancement of perpendicular coercivity for CoPt top layer in CoPt/AlN multilayer structure
Y. Yu, J. Shi, Y. Nakamura
Journal of Applied Physics, 108, 023912, 2010.

Thickness-dependent perpendicular magnetic anisotropy of CoPt layer on CoPt/AlN multilayer
Y. Yu, J. Shi, Y. Nakamura
IEEE Trans. Magn., 46, 1663-1666, 2010.

Room-temperature ferromagnetism in cobalt and aluminum codoping tin oxide diluted magnetic semiconductors
X. Ning, X. Liu, R. Yu, J. Shi, Y. Nakamura
Materials Transactions, 51, 557-560, 2010.

研究業績